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TEM Basics

 
Scanning/tilting alignment
    I
 

The use of two sets of deflection coils enable us to translate (scan) the beam across the specimen without apparently changing the angle of incidence or to tilt the beam without changing its position on the specimen.

The simulation show how each of these effects is achieved.

Why is it important in TEM to be able to translate the beam without tilting it?

 
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